E DIN IEC 62416:2007-08

Hot Carrier Test on MOS Transistors.

STANDARD published on 1.8.2007

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The information about the standard:

Designation standards: E DIN IEC 62416:2007-08
Note: WITHDRAWN
Publication date standards: 1.8.2007
The number of pages: 16
Approximate weight : 48 g (0.11 lbs)
Country: German technical standard
Category: Technical standards DIN

Annotation of standard text E DIN IEC 62416:2007-08 :

Hot-Carrier-Prüfverfahren für MOS-Transistoren.