E ÖVE EN IEC 60749-29

Semiconductor devices - Mechanical and climatic test methods -- Part 29: Latch-up test (IEC 47/2991/CDV) (english version)

STANDARD published on 1.3.2026

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The information about the standard:

Designation standards: E ÖVE EN IEC 60749-29
Publication date standards: 1.3.2026
The number of pages: 78
Approximate weight : 234 g (0.52 lbs)
Country: Austrian technische Norm
Category: Technical standards ÖNORM