GB/T 13388-1992

Method for measuring crystallographic orientation of flats on single crystal silicon slices and wafers by X-ray techniques

STANDARD published on 19.2.1992

English, Chinese -
electronic design (pdf) (298.80 USD)

English, Chinese -

Print design (298.80 USD)

The information about the standard:

Designation standards: GB/T 13388-1992
Note: WITHDRAWN
Publication date standards: 19.2.1992
Country: Chinese technical standard
Category: Technical standards GB