GB/T 14142-1993

Test method for crystallographic perfection of epitaxial layers in silicon by etching techniques

STANDARD published on 6.2.1993

English, Chinese -
electronic design (pdf) (348.80 USD)

The information about the standard:

Designation standards: GB/T 14142-1993
Note: WITHDRAWN
Publication date standards: 6.2.1993
Country: Chinese technical standard
Category: Technical standards GB