GB/T 14142-2017

Test method for crystallographic perfection of epitaxial layers in silicon—Etching technique

STANDARD published on 29.9.2017

English, Chinese -
electronic design (pdf) (166.80 USD)

The information about the standard:

Designation standards: GB/T 14142-2017
Publication date standards: 29.9.2017
Country: Chinese technical standard
Category: Technical standards GB