GB/T 19444-2004

Oxygen precipitation characterization of silicon wafers by measurement of interstitial oxygen reduction

STANDARD published on 5.2.2004

English, Chinese -
electronic design (pdf) (160.80 USD)

The information about the standard:

Designation standards: GB/T 19444-2004
Note: WITHDRAWN
Publication date standards: 5.2.2004
Country: Chinese technical standard
Category: Technical standards GB