GB/T 20176-2006

Surface chemical analysis-Secondary-ion mass spectrometry-Determination of boron atomic concentration in silicon using uniformly doped materials

STANDARD published on 27.3.2006

English, Chinese -
electronic design (pdf) (472.80 USD)

English, Chinese -

Print design (472.80 USD)

The information about the standard:

Designation standards: GB/T 20176-2006
Note: WITHDRAWN
Publication date standards: 27.3.2006
Country: Chinese technical standard
Category: Technical standards GB