GB/T 24577-2009

Test methods for analyzing organic contaminants on silicon wafer surfaces by thermal desorption gas chromatography

STANDARD published on 30.10.2009

English, Chinese -
electronic design (pdf) (418.80 USD)

The information about the standard:

Designation standards: GB/T 24577-2009
Publication date standards: 30.10.2009
Country: Chinese technical standard
Category: Technical standards GB