GB/T 24582-2009

Test method for measuring surface metal contamination of polycrystalline silicon by acid extraction-inductively coupled plasma mass spectrometry

STANDARD published on 30.10.2009

English, Chinese -
electronic design (pdf) (382.80 USD)

English, Chinese -

Print design (382.80 USD)

The information about the standard:

Designation standards: GB/T 24582-2009
Note: WITHDRAWN
Publication date standards: 30.10.2009
Country: Chinese technical standard
Category: Technical standards GB