GB/T 26068-2010

Test method for carrier recombination lifetime in silicon wafers by non-contact measurement of photoconductivity decay by microwave reflectance

STANDARD published on 10.1.2011

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The information about the standard:

Designation standards: GB/T 26068-2010
Note: WITHDRAWN
Publication date standards: 10.1.2011
Country: Chinese technical standard
Category: Technical standards GB