GB/T 26068-2018

Test method for carrier recombination lifetime in silicon wafers and silicon ingots—Non-contact measurement of photoconductivity decay by microwave reflectance method

STANDARD published on 28.12.2018

English, Chinese -
electronic design (pdf) (718.80 USD)

English, Chinese -

Print design (718.80 USD)

The information about the standard:

Designation standards: GB/T 26068-2018
Publication date standards: 28.12.2018
Country: Chinese technical standard
Category: Technical standards GB