GB/T 29849-2013

Test method for measuring surface metallic contamination of silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry

STANDARD published on 12.11.2013

English, Chinese -
electronic design (pdf) (250.80 USD)

English, Chinese -

Print design (250.80 USD)

The information about the standard:

Designation standards: GB/T 29849-2013
Publication date standards: 12.11.2013
Country: Chinese technical standard
Category: Technical standards GB