GB/T 30653-2014

Test method for crystal quality of III-nitride epitaxial layers

STANDARD published on 31.12.2014

English, Chinese -
electronic design (pdf) (226.80 USD)

The information about the standard:

Designation standards: GB/T 30653-2014
Publication date standards: 31.12.2014
Country: Chinese technical standard
Category: Technical standards GB