GB/T 30867-2014

Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers

STANDARD published on 24.7.2014

English, Chinese -
electronic design (pdf) (202.80 USD)

The information about the standard:

Designation standards: GB/T 30867-2014
Note: WITHDRAWN
Publication date standards: 24.7.2014
Country: Chinese technical standard
Category: Technical standards GB