GB/T 30869-2014

Test method for thickness and total thickness variation of silicon wafers for solar cell

STANDARD published on 24.7.2014

English, Chinese -
electronic design (pdf) (226.80 USD)

The information about the standard:

Designation standards: GB/T 30869-2014
Publication date standards: 24.7.2014
Country: Chinese technical standard
Category: Technical standards GB