GB/T 32189-2015

Test method for surface roughness of GaN single crystal substrate by atomic force microscope

STANDARD published on 10.12.2015

English, Chinese -
electronic design (pdf) (286.80 USD)

The information about the standard:

Designation standards: GB/T 32189-2015
Publication date standards: 10.12.2015
Country: Chinese technical standard
Category: Technical standards GB