GB/T 32281-2015

Test method for measuring oxygen, carbon, boron and phosphorus in solar silicon wafers and feedstock by secondary ion mass spectrometry

STANDARD published on 10.12.2015

English, Chinese -
electronic design (pdf) (226.80 USD)

English, Chinese -

Print design (226.80 USD)

The information about the standard:

Designation standards: GB/T 32281-2015
Publication date standards: 10.12.2015
Country: Chinese technical standard
Category: Technical standards GB