GB/T 32495-2016

Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon

STANDARD published on 24.2.2016

English, Chinese -
electronic design (pdf) (352.80 USD)

The information about the standard:

Designation standards: GB/T 32495-2016
Publication date standards: 24.2.2016
Country: Chinese technical standard
Category: Technical standards GB