GB/T 33657-2017

Nanotechnologies—Electrical operating parameter test specification of wafer level nano-scale phase change memory cells

STANDARD published on 12.5.2017

English, Chinese -
electronic design (pdf) (334.80 USD)

The information about the standard:

Designation standards: GB/T 33657-2017
Publication date standards: 12.5.2017
Country: Chinese technical standard
Category: Technical standards GB