GB/T 4058-1995

Test method for detection of oxidation induced defects in polished silicon wafers

STANDARD published on 18.4.1995

English, Chinese -
electronic design (pdf) (448.80 USD)

The information about the standard:

Designation standards: GB/T 4058-1995
Note: WITHDRAWN
Publication date standards: 18.4.1995
Country: Chinese technical standard
Category: Technical standards GB