GB/T 4058-2009

Test method for detection of oxidation induced defects in polished silicon wafers

STANDARD published on 30.10.2009

English, Chinese -
electronic design (pdf) (526.80 USD)

The information about the standard:

Designation standards: GB/T 4058-2009
Publication date standards: 30.10.2009
Country: Chinese technical standard
Category: Technical standards GB