GB/T 41751-2022

Test method for radius of curvature of crystal plane in GaN single crystal substrate wafers

STANDARD published on 12.10.2022

English, Chinese -
electronic design (pdf) (226.80 USD)

The information about the standard:

Designation standards: GB/T 41751-2022
Publication date standards: 12.10.2022
Country: Chinese technical standard
Category: Technical standards GB