GB/T 42907-2023

Test method for excess-charge-carrier recombination lifetime in silicon ingots, silicon bricks and silicon wafers—Noncontact eddy-current sensor

STANDARD published on 6.8.2023

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electronic design (pdf) (418.80 USD)

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Print design (418.80 USD)

The information about the standard:

Designation standards: GB/T 42907-2023
Publication date standards: 6.8.2023
Country: Chinese technical standard
Category: Technical standards GB