GB/T 43226-2023

Time-domain test methods for space single event soft errors of semiconductor integrated circuit

STANDARD published on 7.9.2023

English, Chinese -
electronic design (pdf) (226.80 USD)

The information about the standard:

Designation standards: GB/T 43226-2023
Publication date standards: 7.9.2023
Country: Chinese technical standard
Category: Technical standards GB