GB/T 43315-2023

Test method for flow pattern defects in silicon wafer—Etching technique

STANDARD published on 27.11.2023

English, Chinese -
electronic design (pdf) (250.80 USD)

The information about the standard:

Designation standards: GB/T 43315-2023
Publication date standards: 27.11.2023
Country: Chinese technical standard
Category: Technical standards GB