GB/T 44558-2024

Test method for dislocation imaging in III-nitride semiconductor materials—Transmission electron microscopy

STANDARD published on 29.9.2024

English, Chinese -
electronic design (pdf) (346.80 USD)

The information about the standard:

Designation standards: GB/T 44558-2024
Publication date standards: 29.9.2024
Country: Chinese technical standard
Category: Technical standards GB