GB/T 45716.1-2026

Semiconductor devices—Bias-temperature instability test for metal-oxide semiconductor field-effect transistors (MOSFETs)—Part 1: Fast bias-temperature instability test for MOSFETs

STANDARD published on 30.4.2026

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The information about the standard:

Designation standards: GB/T 45716.1-2026
Note: Execute Date: november 2026
Publication date standards: 30.4.2026
Country: Chinese technical standard
Category: Technical standards GB