GB/T 45716-2025

Semiconductor devices—Bias temperature instability test for metal-oxide semiconductor field-effect transistors (MOSFETs)

STANDARD published on 30.5.2025

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The information about the standard:

Designation standards: GB/T 45716-2025
Note: Execute Date: september 2025
Publication date standards: 30.5.2025
Country: Chinese technical standard
Category: Technical standards GB