GB/T 45718-2025

Semiconductor devices—Time dependent dielectric breakdown (TDDB) test for inter-metal layers

STANDARD published on 30.5.2025

English, Chinese -
electronic design (pdf) (ON REQUEST)

The information about the standard:

Designation standards: GB/T 45718-2025
Note: Execute Date: september 2025
Publication date standards: 30.5.2025
Country: Chinese technical standard
Category: Technical standards GB