GB/T 47080-2026

Test method for dislocation density of diamond single crystal polished wafer

STANDARD published on 28.1.2026

English, Chinese -
electronic design (pdf) (214.80 USD)

The information about the standard:

Designation standards: GB/T 47080-2026
Publication date standards: 28.1.2026
Country: Chinese technical standard
Category: Technical standards GB