GB/T 47082-2026

Test method for stacking faults of polished monocrystalline silicon carbide wafers

STANDARD published on 28.1.2026

English, Chinese -
electronic design (pdf) (190.80 USD)

The information about the standard:

Designation standards: GB/T 47082-2026
Note: Execute Date: august 2026
Publication date standards: 28.1.2026
Country: Chinese technical standard
Category: Technical standards GB