
Semiconductor devices—Flexible and stretchable semiconductor devices—Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
STANDARD published on 27.2.2026
Designation standards: GB/T 47239.9-2026
Note: Execute Date: september 2026
Publication date standards: 27.2.2026
Country: Chinese technical standard
Category: Technical standards GB