GB/T 4937.29-2025

Semiconductor devices—Mechanical and climatic test methods—Part 29: Latch-up test

STANDARD published on 2.12.2025

English, Chinese -
electronic design (pdf) (640.80 USD)

The information about the standard:

Designation standards: GB/T 4937.29-2025
Publication date standards: 2.12.2025
Country: Chinese technical standard
Category: Technical standards GB