GB/T 4937.31-2023

Semiconductor devices—Mechanical and climatic test methods—Part 31:Flammability of platic-encapsulated devicesinternally induced

STANDARD published on 23.5.2023

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The information about the standard:

Designation standards: GB/T 4937.31-2023
Publication date standards: 23.5.2023
Country: Chinese technical standard
Category: Technical standards GB