GB/T 4937.4-2012

Semiconductor devices - Mechanical and climatic test methods - Part 4: Damp heat, steady state, highly accelerated stress test (HAST)

STANDARD published on 5.11.2012

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The information about the standard:

Designation standards: GB/T 4937.4-2012
Publication date standards: 5.11.2012
Country: Chinese technical standard
Category: Technical standards GB