GB/T 4937.44-2025

Semiconductor devices—Mechanical and climatic test methods—Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

STANDARD published on 2.12.2025

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The information about the standard:

Designation standards: GB/T 4937.44-2025
Publication date standards: 2.12.2025
Country: Chinese technical standard
Category: Technical standards GB