GB/T 6616-1995

Test method for measuring resistivity of semiconductor silicon or sheet resistance of semiconductor films with a noncontact eddy-current gage

STANDARD published on 18.4.1995

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The information about the standard:

Designation standards: GB/T 6616-1995
Note: WITHDRAWN
Publication date standards: 18.4.1995
Country: Chinese technical standard
Category: Technical standards GB