GB/T 6616-2009

Test methods for measuring resistivity of semiconductor wafers or sheet resistance of semiconductor films with a noncontact eddy-current gauge

STANDARD published on 30.10.2009

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The information about the standard:

Designation standards: GB/T 6616-2009
Note: WITHDRAWN
Publication date standards: 30.10.2009
Country: Chinese technical standard
Category: Technical standards GB