GB/T 6617-2009

Test method for measuring resistivity of silicon wafer using spreading resistance probe

STANDARD published on 30.10.2009

English, Chinese -
electronic design (pdf) (226.80 USD)

The information about the standard:

Designation standards: GB/T 6617-2009
Publication date standards: 30.10.2009
Country: Chinese technical standard
Category: Technical standards GB