GB/T 6621-1995

Test methods for surface flatness of silicon polished slices

STANDARD published on 18.4.1995

English, Chinese -
electronic design (pdf) (548.80 USD)

The information about the standard:

Designation standards: GB/T 6621-1995
Note: WITHDRAWN
Publication date standards: 18.4.1995
Country: Chinese technical standard
Category: Technical standards GB