GB/T 6624-2009

Standard method for measuring the surface quality of polished silicon slices by visual inspection

STANDARD published on 30.10.2009

English, Chinese -
electronic design (pdf) (178.80 USD)

The information about the standard:

Designation standards: GB/T 6624-2009
Publication date standards: 30.10.2009
Country: Chinese technical standard
Category: Technical standards GB