GOST R 8.698-2010

State system for ensuring the uniformity of measurements. Dimensional parameters of nanoparticles and thin films. Method for measurement by means of a small angle X-ray scattering diffractometer

STANDARD published on 1.9.2010

English and Russian -
electronic design (pdf) (835.00 USD)

English and Russian -

Print design (835.00 USD)

Russian -

electronic design (pdf) (144.30 USD)

Russian -

Print design (144.30 USD)

The information about the standard:

Designation standards: GOST R 8.698-2010
Publication date standards: 1.9.2010
The number of pages: 38
Approximate weight : 114 g (0.25 lbs)
Country: Russian technical standard
Category: Technical standards GOST