
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
STANDARD published on 30.1.2003
Designation standards: IEC 60749-11-ed.1.0/Cor.1
Note: Correction
Publication date standards: 30.1.2003
Approximate weight : 300 g (0.66 lbs)
Country: International technical standard
Category: Technical standards IEC