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IEC 60749-8-ed.1.0

Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing

STANDARD published on 30.8.2002

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electronic design (pdf) (125.10 USD)
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Print design (125.10 USD)
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CD-ROM (127.10 USD)

The information about the standard:

Designation standards: IEC 60749-8-ed.1.0
Publication date standards: 30.8.2002
The number of pages: 31
Approximate weight : 93 g (0.21 lbs)
Country: International technical standard
Category: Technical standards IEC

Annotation of standard text IEC 60749-8-ed.1.0 :

Applicable to semiconductor devices (discrete devices and integrated circuits), it determines the leak rate of semiconductor devices. The contents of the corrigenda of April 2003 and August 2003 have been included in this copy. Applicable aux dispositifs a semiconducteurs (dispo-sitifs discrets et circuits integres), determine le taux de fuite des dispositifs a semiconducteurs. Le contenu des corrigenda davril 2003 et daout 2003 a ete pris en consideration dans cet exemplaire.