Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
STANDARD published on 25.6.2015
Designation standards: IEC 61338-1-5-ed.1.0
Publication date standards: 25.6.2015
The number of pages: 40
Approximate weight : 120 g (0.26 lbs)
Country: International technical standard
Category: Technical standards IEC
IEC 61338-1-5:2015 describes a measurement method for resistance and effective conductivity at the interface between conductor layer and dielectric substrate, which are called interface resistance and interface conductivity. This first edition cancels and replaces IEC PAS 61338-1-5 published in 2010. This edition includes the following significant technical changes with respect to the previous edition: a) description of technical content related to patents (Japanese patent numbers JP3634966, JP3735501) in the Introduction; b) changes to normative references; c)addition to bibliography. LIEC 61338-1-5:2015 decrit une methode de mesure de la resistance et de la conductivite efficace au niveau de linterface entre la couche conductrice et le substrat dielectrique, appelees resistance dinterface et conductivite dinterface. Cette premiere edition annule et remplace lIEC PAS 61338-1-5 parue en 2010. Cette edition inclut les modifications techniques majeures suivantes par rapport a ledition precedente: a) description de contenu technique lie a des brevets (brevets japonais numero JP3634966 et JP3735501) dans lIntroduction; b) modifications de references normatives; c) ajout bibliographique.