IEC 62047-40-ed.1.0

Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of micro-electromechanical inertial shock switch threshold

STANDARD published on 3.9.2021

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The information about the standard:

Designation standards: IEC 62047-40-ed.1.0
Publication date standards: 3.9.2021
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: International technical standard
Category: Technical standards IEC

Annotation of standard text IEC 62047-40-ed.1.0 :

IEC 62047-40:2021(E) specifies the test conditions and methods of micro-electromechanical inertial shock switch threshold. This document applies to normally open micro-electromechanical inertial shock switch.