IEC 62373-ed.1.0

Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)

STANDARD published on 18.7.2006

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The information about the standard:

Designation standards: IEC 62373-ed.1.0
Publication date standards: 18.7.2006
The number of pages: 27
Approximate weight : 81 g (0.18 lbs)
Country: International technical standard
Category: Technical standards IEC

Annotation of standard text IEC 62373-ed.1.0 :

Provides a test procedure for a bias-temperature (BT) stability test of metal-oxide semiconductor, field-effect transistors (MOSFET) Fournit une procedure dessai pour la stabilite de temperature en polarisation (essai BT) des MOSFET (transistor a effet de champ metaloxyde-semiconducteurs)