IEC 62374-ed.1.0

Semiconductor devices - Time dependent dielectric breakdown (TDDB) test for gate dielectric films

STANDARD published on 29.3.2007

English and French -
electronic design (pdf) (233.20 USD)

English and French -

Print design (233.20 USD)

English and French -

CD-ROM (235.10 USD)

The information about the standard:

Designation standards: IEC 62374-ed.1.0
Publication date standards: 29.3.2007
The number of pages: 43
Approximate weight : 129 g (0.28 lbs)
Country: International technical standard
Category: Technical standards IEC

Annotation of standard text IEC 62374-ed.1.0 :

Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure Cette norme decrit une methode d essai de la rupture dielectrique en fonction du temps (TDDB) pour films dielectriques de grille des dispositifs a semiconducteurs et une methode d estimation de la duree de vie de produit en presence d unedefaillance de type TDDB.