IEC/TR 63133-ed.1.0

Semiconductor devices - Scan based ageing level estimation for semiconductor devices

STANDARD published on 11.10.2017

English -
electronic design (pdf) (151.80 USD)

English -

Print design (151.80 USD)

English -

CD-ROM (153.50 USD)

The information about the standard:

Designation standards: IEC/TR 63133-ed.1.0
Publication date standards: 11.10.2017
The number of pages: 17
Approximate weight : 51 g (0.11 lbs)
Country: International technical standard
Category: Technical standards IEC

Annotation of standard text IEC/TR 63133-ed.1.0 :

IEC TR 63133:2017(E) specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.