IEC 62415-ed.1.0

Semiconductor devices - Constant current electromigration test

STANDARD published on 19.5.2010

English and French -
electronic design (pdf) (52.80 USD)

English and French -

Print design (52.80 USD)

English and French -

CD-ROM (54.50 USD)

The information about the standard:

Designation standards: IEC 62415-ed.1.0
Publication date standards: 19.5.2010
The number of pages: 22
Approximate weight : 66 g (0.15 lbs)
Country: International technical standard
Category: Technical standards IEC

Annotation of standard text IEC 62415-ed.1.0 :

IEC 62415:2010 describes a method for conventional constant current electromigration testing of metal lines, via string and contacts. La CEI 62415:2010 decrit une methode pour des essais conventionnels delectromigration en courant constant de lignes metalliques, de chaines de trous de liaison et de contacts de trous de liaison.